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Using dynamic shift to reduce test data volume in high-compression designs

Type: Conference Paper

Author : Xijiang Lin , Kassab, M. , Rajski, J.

Publisher: IEEE

Year: 2014

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Type: Journal Paper

Author : Janicki, Jakub; Kassab, M.; Mrugalski, Grzegorz; Mukherjee, Nandini; Rajski, J.; Tyszer, J.

Publisher: IEEE

Year: 2014

Isometric test compression with low toggling activity

Type: Conference Paper

Author : Kumar, A.; Kassab, M.; Moghaddam, E.; Mukherjee, N.; Rajski, J.; Reddy, S.M.; Tyszer, J.; Wang, C.

Publisher: IEEE

Year: 2014

Cell-Aware Test

Type: Journal Paper

Author : Hapke, Friedrich; Redemund, Wilfried; Glowatz, A.; Rajski, J.; Reese, Michael; Hustava, Marek; Keim, Martin; Schloeffel, Juergen; Fast, Anja

Publisher: IEEE

Year: 2014

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Using dynamic shift to reduce test data volume in high-compression designs

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Isometric test compression with low toggling activity

Cell-Aware Test

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Using dynamic shift to reduce test data volume in high-compression designs

Erratum to &#x201C;Test Time Reduction in EDT Bandwidth Management for SoC Designs&#x201D; [Nov 13 1776-1786]

Isometric test compression with low toggling activity

Cell-Aware Test

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]