Search

Now showing items 1-5 of 5

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Type: Journal Paper

Author : Privat, A.; Touboul, A.D.; Michez, A.; Bourdarie, S.; Vaille, J.R.; Wrobel, F.; Chatry, N.; Chaumont, G.; Lorfevre, E.; Bezerra, F.; Saigne, F.

Publisher: IEEE

Year: 2014

Impact of Neutron-Induced Displacement Damage<newline/> on the ATREE Response in LM124 <newline/>Operational Amplifier

Type: Journal Paper

Author : Roig, Fabien; Dusseau, L.; Ribeiro, P.; Auriel, G.; Roche, Nicholas J.-H; Privat, A.; Vaille, J.-R.; Boch, J.; Saigne, F.; Marec, R.; Calvel, P.; Bezerra, F.; Ecoffet, R.; Azais, Bruno

Publisher: IEEE

Year: 2014

The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Type: Journal Paper

Publisher: IEEE

Year: 2014

Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier

Type: Journal Paper

Author : Roig, Fabien; Dusseau, L.; Ribeiro, P.; Auriel, G.; Roche, Nicholas J.-H; Privat, A.; Vaillé , J.-R.; Boch, J.; Saigné , Fré dé ric; Marec, R.; Calvel, P.; Bezerra, F.; Ecoffet, R.; Azais, Bruno

Publisher: IEEE

Year: 2014

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

Type: Journal Paper

Author : Privat, A.; Touboul, A.D.; Petit, Marc; Huselstein, J.J.; Wrobel, F.; Forest, Francois; Vaillé , J.R.; Bourdarie, S.; Arinero, R.; Chatry, N.; Chaumont, G.; Lorfè vre, E.; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

Search

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Impact of Neutron-Induced Displacement Damage<newline/> on the ATREE Response in LM124 <newline/>Operational Amplifier

The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

Author

Publisher

Year

Keywords

Type

Language (ISO)

Content Type

Publication Title

Search

Filters

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Impact of Neutron-Induced Displacement Damage<newline/> on the ATREE Response in LM124 <newline/>Operational Amplifier

The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier

Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation