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QED post-silicon validation and debug: Invited abstract

Type: Conference Paper

Author : Lin, David; Mitra, Subhasish

Publisher: IEEE

Year: 2014

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Type: Conference Paper

Author : Purtell, Michael; Mitra, Subhasish

Publisher: IEEE

Year: 2014

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Testing for Transistor Aging

Type: Journal Paper

Author : Baba, Altug Hakan; Mitra, Subhasish

Year: 2009

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Integrating Radio Imaging With Gene Expressions Toward a Personalized Management of Cancer

Type: Journal Paper

Author : Mitra, Subhasish; Shankar, B. Uma

Publisher: IEEE

Year: 2014

Soft Errors: Technology Trends, System Effects, and Protection Techniques

Type: Journal Paper

Author : Mitra, Subhasish, Pia Sanda, and Norbert Seifert.

Publisher: IEEE

Year: 2007

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Soft Errors: Technology Trends, System Effects, and Protection Techniques

Type: Journal Paper

Author : Mitra, Subhasish, Pia Sanda, and Norbert Seifert.

Publisher: IEEE

Year: 2007

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Soft Errors: Technology Trends, System Effects, and Protection Techniques

Type: Journal Paper

Author : Mitra, Subhasish, Pia Sanda, and Norbert Seifert.

Publisher: IEEE

Year: 2007

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Guest Editorial: Robust and energy-secure systems

Type: Journal Paper

Author : Vega, A.; Sethumadhavan, Simha; Mitra, Subhasish

Publisher: IEEE

Year: 2014

Error Correction Algorithm for High Accuracy Bio-Impedance Measurement in Wearable Healthcare Applications

Type: Journal Paper

Author : Kubendran, Rajkumar; Lee, Sang-Rim; Mitra, Subhasish; Yazicioglu, Refet Firat

Publisher: IEEE

Year: 2014

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2013.04.14-2013.04.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Reliability of graphene interconnects and n-type doping of carbon nanotube transistors

Type: Journal Paper

Author : Liyanage, Luckshitha Suriyasena; Chen, Xiangyu; Wei, Hai; Chen, Hong-Yu; Mitra, Subhasish; Wong, H. -S. Philip

Year: 2013

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QED post-silicon validation and debug: Invited abstract

Welcome message

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Testing for Transistor Aging

Integrating Radio Imaging With Gene Expressions Toward a Personalized Management of Cancer

Soft Errors: Technology Trends, System Effects, and Protection Techniques

Soft Errors: Technology Trends, System Effects, and Protection Techniques

Soft Errors: Technology Trends, System Effects, and Protection Techniques

Guest Editorial: Robust and energy-secure systems

Error Correction Algorithm for High Accuracy Bio-Impedance Measurement in Wearable Healthcare Applications

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2013.04.14-2013.04.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Reliability of graphene interconnects and n-type doping of carbon nanotube transistors

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QED post-silicon validation and debug: Invited abstract

Welcome message

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Testing for Transistor Aging

Integrating Radio Imaging With Gene Expressions Toward a Personalized Management of Cancer

Soft Errors: Technology Trends, System Effects, and Protection Techniques

Soft Errors: Technology Trends, System Effects, and Protection Techniques

Soft Errors: Technology Trends, System Effects, and Protection Techniques

Guest Editorial: Robust and energy-secure systems

Error Correction Algorithm for High Accuracy Bio-Impedance Measurement in Wearable Healthcare Applications

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2013.04.14-2013.04.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Reliability of graphene interconnects and n-type doping of carbon nanotube transistors