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Thermal and Power Management of Integrated Circuits

Type: Ebook

Author : Arman Vassighi; Manoj Sachdev

Publisher: Springer

Year: 2006

Defect Oriented Testing for CMOS Analog and Digital Circuits

Type: Ebook

Author : Manoj Sachdev (auth.)

Publisher: Springer US

Year: 1999

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Type: Ebook

Author : Andrei Pavlov; Manoj Sachdev

Publisher: Springer

Year: 2008

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Segmented Virtual Ground Architecture for Low-Power Embedded SRAM

Type: Journal Paper

Author : Mohammad Sharifkhani; Manoj Sachdev

Year: 2007

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Comparative Robustness of CML Phase Detectors for Clock and Data Recovery Circuits

Type: Journal Paper

Author : David Rennie; Manoj Sachdev

Year: 2007

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ESD Protection Device and Circuit Design for Advanced CMOS Technologies

Type: Ebook

Author : Oleg Semenov; Hossein Sarbishaei; Manoj Sachdev

Publisher: Springer

Year: 2008

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A fully digital ADC using a new delay element with enhanced linearity

Type: Conference Paper

Author : Hooman Farkhani; Mohammad Meymandi-Nejad; Manoj Sachdev

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A new linear delay element with self calibration

Type: Journal Paper

Author : Afshin Seraj; Mohammad Maymandi-Nejad; Manoj Sachdev

Year: 2015

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A new linear delay element with self calibration

Type: Journal Paper

Author : Afshin Seraj; Mohammad Maymandi-Nejad; Manoj Sachdev

Year: 2015

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition

Type: Ebook

Author : Manoj Sachdev; Jos� Pineda de Gyvez (auth.); Manoj Sachdev; Jos� Pineda de Gyvez (eds.)

Publisher: Springer US

Year: 2007

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Thermal and Power Management of Integrated Circuits

Defect Oriented Testing for CMOS Analog and Digital Circuits

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Segmented Virtual Ground Architecture for Low-Power Embedded SRAM

Comparative Robustness of CML Phase Detectors for Clock and Data Recovery Circuits

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

A fully digital ADC using a new delay element with enhanced linearity

A new linear delay element with self calibration

A new linear delay element with self calibration

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition

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Thermal and Power Management of Integrated Circuits

Defect Oriented Testing for CMOS Analog and Digital Circuits

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Segmented Virtual Ground Architecture for Low-Power Embedded SRAM

Comparative Robustness of CML Phase Detectors for Clock and Data Recovery Circuits

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

A fully digital ADC using a new delay element with enhanced linearity

A new linear delay element with self calibration

A new linear delay element with self calibration

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition