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    Efficient evaluation of specific absorption rate for MIMO terminals 

    Type: Journal Paper
    Author : Li, Huaqing; Lau, B.K.
    Publisher: IET
    Year: 2014

    In Memoriam Susan Hong Xu (1952–2014) (Associate Editor of IEEE Transactions on Reliability) 

    Type: Journal Paper
    Author : Kuo, Wei-Hung; Li, Huaqing; Rupe, Jason
    Publisher: IEEE
    Year: 2014

    Direct three-dimensional head pose estimation from Kinect-type sensors 

    Type: Journal Paper
    Author : Kondori, Farid Abedan; Yousefi, Siamak; Li, Huaqing
    Publisher: IET
    Year: 2014

    Sensor-Driven Area Coverage for an Autonomous Fixed-Wing Unmanned Aerial Vehicle 

    Type: Journal Paper
    Author : Paull, Liam; Thibault, Carl; Nagaty, Amr; Seto, Mae; Li, Huaqing
    Publisher: IEEE
    Year: 2014

    AUV Navigation and Localization: A Review 

    Type: Journal Paper
    Author : Paull, Liam; Saeedi, Saeed; Seto, Mae; Li, Huaqing
    Publisher: IEEE
    Year: 2014

    Group Mapping: A Topological Approach to Map Merging for Multiple Robots 

    Type: Journal Paper
    Author : Saeedi, Saeed; Paull, Liam; Trentini, Michael; Seto, Mae; Li, Huaqing
    Publisher: IEEE
    Year: 2014

    A Novel Self-Reference Technique for STT-RAM Read and Write Reliability Enhancement 

    Type: Journal Paper
    Author : Eken, Enes; Yaojun Zhang; Wujie Wen; Joshi, Rajan; Li, Huaqing; Yiran Chen
    Publisher: IEEE
    Year: 2014

    Energy-efficient and temperature-stable oxide-confined 980 nm VCSELs operating error-free at 38 Gbit/s at 85°C 

    Type: Journal Paper
    Author : Li, Huaqing; Wolf, Philip; Moser, Philip; Larisch, Gunter; Mutig, Alex; Lott, James /A/.; Bimberg, Dieter
    Publisher: IET
    Year: 2014

    The resistivity of oil and oil-impregnated pressboard varies with temperature and electric field strength 

    Type: Journal Paper
    Author : Li, Huaqing; Zhong, Li-Rong; Yu, Qian; Mori, Shinsuke; Yamada, Shigeru
    Publisher: IEEE
    Year: 2014

    Error-free 46 Gbit/s operation of oxide-confined 980 nm VCSELs at 85°C 

    Type: Journal Paper
    Author : Moser, Philip; Lott, James /A/.; Wolf, Philip; Larisch, Gunter; Li, Huaqing; Bimberg, Dieter
    Publisher: IET
    Year: 2014
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