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Coverage Optimization and Power Reduction in SFN Using Simulated Annealing

Type: Journal Paper

Author : Lanza, Mario; Gutierrez, Angel L.; Perez, Jesus R.; Morgade, Javier; Domingo, Marta; Valle, Luis; Angueira, Pablo; Basterrechea, Jose

Publisher: IEEE

Year: 2014

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

Type: Journal Paper

Author : Qian Wu; Bayerl, A.; Porti, M.; Martin-Martinez, J.; Lanza, Mario; Rodriguez, Roberto; Velayudhan, V.; Nafria, M.; Aymerich, X.; Bargallo Gonzalez, Mireia; Simoen, Eddy

Publisher: IEEE

Year: 2014

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Coverage Optimization and Power Reduction in SFN Using Simulated Annealing

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

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Coverage Optimization and Power Reduction in SFN Using Simulated Annealing

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs