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Now showing items 1-10 of 16
An Analytical Model With 2-D Effects for 4H-SiC Trenched Junction Barrier Schottky Diodes
Publisher: IEEE
Year: 2014
High Temperature Stability and the Performance Degradation of SiC MOSFETs
Publisher: IEEE
Year: 2014
High temperature stability evaluation of SiC MOSFETs
Publisher: IEEE
Year: 2014
A 3600 V/80 A Series--Parallel-Connected Silicon Carbide MOSFETs Module With a Single External Gate Driver
Publisher: IEEE
Year: 2014
An All-SiC High-Frequency Boost DC–DC Converter Operating at 320 °C Junction Temperature
Publisher: IEEE
Year: 2014