Search
Now showing items 1-7 of 7
Total Ionizing Dose Retention Capability of Conductive Bridging Random Access Memory
Publisher: IEEE
Year: 2014
Investigation of Single Event Induced Soft Errors in Programmable Metallization Cell Memory
Publisher: IEEE
Year: 2014
Ionizing Radiation Effects on Nonvolatile Memory Properties of Programmable Metallization Cells
Publisher: IEEE
Year: 2014
Flexible Sensors Based on Radiation-Induced Diffusion of Ag in Chalcogenide Glass
Publisher: IEEE
Year: 2014
Structural and Material Changes in Thin Film Chalcogenide Glasses Under Ar-Ion Irradiation
Publisher: IEEE
Year: 2014