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Dominant factor of contact resistance analyzed by conductive-AFM

Type: Conference Paper

Author : Omura, Ayako; Fukuta, Megumi; Miyake, Koji; Kondo, Takaya; Onuma, Masanori

Publisher: IEEE

Year: 2014

An analysis of relationship between contact resistance and fracture of oxide film for connector contacts using finite element method

Type: Conference Paper

Author : Kondo, Takaya; Nakata, Hirohito; Sekikawa, Junya; Kubota, Yoshihiro; Hayakawa, Kunio; Nakamura, Tamotsu

Publisher: IEEE

Year: 2014

The investigation of electrical contacts using newly designed nano-indentation manipulator in scanning electron microscope

Type: Conference Paper

Author : Shimizu, Tetsuo; Horie, Tomoyuki; Watanabe, Norimichi; Miyawaki, Jun; Fujii, Shunjiro; Yamagata, Yoshinori; Kondo, Takaya; Onuma, Masanori

Publisher: IEEE

Year: 2014

Constriction resistance of physical simulated electrical contacts with nanofabrication

Type: Conference Paper

Author : Fukuyama, Yasuhiro; Sakamoto, Norihiko; Kaneko, Nobu-hisa; Kondo, Takaya; Onuma, Masanori

Publisher: IEEE

Year: 2014

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Dominant factor of contact resistance analyzed by conductive-AFM

An analysis of relationship between contact resistance and fracture of oxide film for connector contacts using finite element method

The investigation of electrical contacts using newly designed nano-indentation manipulator in scanning electron microscope

Constriction resistance of physical simulated electrical contacts with nanofabrication

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Dominant factor of contact resistance analyzed by conductive-AFM

An analysis of relationship between contact resistance and fracture of oxide film for connector contacts using finite element method

The investigation of electrical contacts using newly designed nano-indentation manipulator in scanning electron microscope

Constriction resistance of physical simulated electrical contacts with nanofabrication