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Agile OLT-protection method based on backup wavelength and discovery process for resilient WDM/TDM-PON
Publisher: IEEE
Year: 2014
X-Ray Diffraction Measurements of the Fe-Rh Alloy Under High Magnetic Fields and at High Temperatures
Publisher: IEEE
Year: 2014
Deteriorated Device Characteristics in 3D-LSI Caused by Distorted Silicon Lattice
Publisher: IEEE
Year: 2014