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Compact Modeling of Flicker Noise in HEMTs

Type: Journal Paper

Author : Dasgupta, Avirup; Khandelwal, Sourabh; Chauhan, Yogesh Singh

Publisher: IEEE

Year: 2014

Modeling 20-nm Germanium FinFET With the Industry Standard FinFET Model

Type: Journal Paper

Author : Khandelwal, Sourabh; Duarte, Juan Pablo; Chauhan, Yogesh Singh; Chenming Hu

Publisher: IEEE

Year: 2014

Modeling of GaN-Based Normally-Off FinFET

Type: Journal Paper

Author : Yadav, Chandresh; Kushwaha, Pragya; Khandelwal, Sourabh; Duarte, Juan Pablo; Chauhan, Yogesh Singh; Chenming Hu

Publisher: IEEE

Year: 2014

BSIM-IMG with improved surface potential calculation recipe

Type: Conference Paper

Author : Kushwaha, Pragya; Yadav, Chandan; Agarwal, Harshit; Chauhan, Yogesh Singh; Srivatsava, Jandhyala; Khandelwal, Sourabh; Duarte, Juan Pablo; Hu, Chenming

Publisher: IEEE

Year: 2014

BSIM6: Analog and RF Compact Model for Bulk MOSFET

Type: Journal Paper

Author : Chauhan, Yogesh Singh; Venugopalan, Sarad; Chalkiadaki, Maria-Anna; Karim, Muhammed Ahosan Ul; Agarwal, Harshit; Khandelwal, Sourabh; Paydavosi, Navid; Duarte, Juan Pablo; Enz, C.C.; Niknejad, Ali M.; Chenming Hu

Publisher: IEEE

Year: 2014

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Compact Modeling of Flicker Noise in HEMTs

Modeling 20-nm Germanium FinFET With the Industry Standard FinFET Model

Modeling of GaN-Based Normally-Off FinFET

BSIM-IMG with improved surface potential calculation recipe

BSIM6: Analog and RF Compact Model for Bulk MOSFET

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Compact Modeling of Flicker Noise in HEMTs

Modeling 20-nm Germanium FinFET With the Industry Standard FinFET Model

Modeling of GaN-Based Normally-Off FinFET

BSIM-IMG with improved surface potential calculation recipe

BSIM6: Analog and RF Compact Model for Bulk MOSFET