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Using dynamic shift to reduce test data volume in high-compression designs

Type: Conference Paper

Author : Xijiang Lin , Kassab, M. , Rajski, J.

Publisher: IEEE

Year: 2014

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Type: Journal Paper

Author : Janicki, Jakub; Kassab, M.; Mrugalski, Grzegorz; Mukherjee, Nandini; Rajski, J.; Tyszer, J.

Publisher: IEEE

Year: 2014

Mutual relations between petrographical and petrophysical properties of Cretaceous rock samples for some wells in the North Western Desert, Egypt

Type: Journal Paper

Author : Kassab, M.A.; Abdou, A.A.; El Gendy, N.H.; Shehata, M.G.; Abuhagaza, A.A.

Year: 2013

Isometric test compression with low toggling activity

Type: Conference Paper

Author : Kumar, A.; Kassab, M.; Moghaddam, E.; Mukherjee, N.; Rajski, J.; Reddy, S.M.; Tyszer, J.; Wang, C.

Publisher: IEEE

Year: 2014

Author

Kassab, M. (2)

Rajski, J. (2)

Tyszer, J. (2)

Abdou, A.A. (1)

Abuhagaza, A.A. (1)

El Gendy, N.H. (1)

Janicki, Jakub (1)

Kassab, M.A. (1)

Kumar, A. (1)

Moghaddam, E. (1)

Publisher

IEEE (3)

Year

2014 (3)

2013 (1)

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Androids (1)

Automatic test equipment (1)

Bandwidth (1)

Cognitive radio (1)

Fading (1)

Gain (1)

Integrated circuit testing (1)

Interference (1)

n Android (1)

n Computer crashes (1)

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Conference Paper (2)

Journal Paper (2)

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English (4)

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Metadata Only (3)

Fulltext (1)

Publication Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on (1)

est Conference (ITC), 2014 IEEE International (1)

est Symposium (ETS), 2014 19th IEEE European (1)

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