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Now showing items 1-5 of 5
NBTI and Leakage Reduction Using ILP-Based Approach
Publisher: IEEE
Year: 2014
Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing
Publisher: IEEE
Year: 2014
BTI-Aware Sleep Transistor Sizing Algorithm for Reliable Power Gating Designs
Publisher: IEEE
Year: 2014
CASA: Contention-Aware Scratchpad Memory Allocation for Online Hybrid On-Chip Memory Management
Publisher: IEEE
Year: 2014