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    Decay Rate Estimators and Their Performance for Blind Reverberation Time Estimation 

    Type: Journal Paper
    Author : Schuldt, C.; Handel, Peter
    Publisher: IEEE
    Year: 2014

    Risk assessment of vehicle cornering events in GNSS data driven insurance telematics 

    Type: Conference Paper
    Author : Wahlstrom, Johan; Skog, Isaac; Handel, Peter
    Publisher: IEEE
    Year: 2014

    IEEE-STD-1057 Three Parameter Sine Wave Fit for SNR Estimation: Performance Analysis and Alternative Estimators 

    Type: Journal Paper
    Author : Negusse, Senay; Handel, Peter; Zetterberg, Per
    Publisher: IEEE
    Year: 2014

    Aligning the Forces—Eliminating the Misalignments in IMU Arrays 

    Type: Journal Paper
    Author : Nilsson, John-Olof; Skog, Isaac; Handel, Peter
    Publisher: IEEE
    Year: 2014

    Smartphone-Based Measurement Systems for Road Vehicle Traffic Monitoring and Usage-Based Insurance 

    Type: Journal Paper
    Author : Handel, Peter; Ohlsson, Jens; Ohlsson, Martin; Skog, Isaac; Nygren, Elin
    Publisher: IEEE
    Year: 2014

    Static Integral Nonlinearity Modeling and Calibration of Measured and Synthetic Pipeline Analog-to-Digital Converters 

    Type: Journal Paper
    Author : Medawar, Samer; Murmann, Boris; Handel, Peter; Bjorsell, Niclas; Jansson, Magnus
    Publisher: IEEE
    Year: 2014

    Impact of Scattering Within a Multipath Simulator Antenna Array on the Ricean Fading Distribution Parameters in OTA Testing 

    Type: Journal Paper
    Author : Alayon Glazunov, Andres; Prasad, Santasriya; Handel, Peter; Bolin, T.; Prytz, Kjell
    Publisher: IEEE
    Year: 2014

    Behavioral Modeling and Linearization of Crosstalk and Memory Effects in RF MIMO Transmitters 

    Type: Journal Paper
    Author : Amin, Saurabh; Landin, Per N.; Handel, Peter; Rö nnow, Daniel
    Publisher: IEEE
    Year: 2014

    Insurance Telematics: Opportunities and Challenges with the Smartphone Solution 

    Type: Journal Paper
    Author : Handel, Peter; Skog, Isaac; Wahlstrom, Johan; Bonawiede, Farid; Welch, Richard; Ohlsson, Jens; Ohlsson, Martin
    Publisher: IEEE
    Year: 2014

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