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Analytical modelling and leakage optimization in complementary resistive switch (CRS) crossbar arrays

Type: Conference Paper

Author : Ambrogio, S.; Balatti, S.; Ielmini, D.; Gilmer, D.C.

Publisher: IEEE

Year: 2014

Analytical Modeling of Oxide-Based Bipolar Resistive Memories and Complementary Resistive Switches

Type: Journal Paper

Author : Ambrogio, Stefano; Balatti, S.; Gilmer, D.C.; Ielmini, Daniele

Publisher: IEEE

Year: 2014

AC Variability and Endurance Measurement Technique for Resistive Switching Memories

Type: Journal Paper

Author : Deora, S.; Bersuker, Gennadi; Matthews, K.; Gilmer, D.C.; Kirsch, P.D.

Publisher: IEEE

Year: 2014

Author

Gilmer, D.C. (3)

Balatti, S. (2)

Ambrogio, S. (1)

Ambrogio, Stefano (1)

Bersuker, Gennadi (1)

Deora, S. (1)

Ielmini, D. (1)

Ielmini, Daniele (1)

Kirsch, P.D. (1)

Matthews, K. (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

random-access storage (2)

/sub&gt (1)

2&lt (1)

AC measurement setup (1)

AC variability measurement technique (1)

analytical modeling (1)

Analytical models (1)

bipolar resistive memories (1)

complementary resistive switches (1)

Complementary resistive switching (CRS) (1)

Type

Journal Paper (2)

Conference Paper (1)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

Device and Materials Reliability, IEEE Transactions on (1)

Electron Devices, IEEE Transactions on (1)

olid State Device Research Conference (ESSDERC), 2014 44th European (1)

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