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Defect-Centric Distribution of Channel Hot Carrier Degradation in Nano-MOSFETs

Type: Journal Paper

Author : Procel, Luis Miguel; Crupi, Felice; Franco, Jacopo; Trojman, Lionel; Kaczer, Ben

Publisher: IEEE

Year: 2014

Border Traps in InGaAs nMOSFETs Assessed by Low-Frequency Noise

Type: Journal Paper

Author : Scarpino, Mercedes; Gupta, Swastik; Lin, Dongyang; Alian, A.; Crupi, Felice; Collaert, Nadine; Thean, A.; Simoen, Eddy

Publisher: IEEE

Year: 2014

Impact of the Substrate Orientation on CHC Reliability in n-FinFETs—Separation of the Various Contributions

Type: Journal Paper

Author : Tallarico, Andrea Natale; Moonju Cho; Franco, Jacopo; Ritzenthaler, R.; Togo, Mitsuhiro; Horiguchi, Naoto; Groeseneken, Guido; Crupi, Felice

Publisher: IEEE

Year: 2014

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Defect-Centric Distribution of Channel Hot Carrier Degradation in Nano-MOSFETs

Border Traps in InGaAs nMOSFETs Assessed by Low-Frequency Noise

Impact of the Substrate Orientation on CHC Reliability in n-FinFETs—Separation of the Various Contributions

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Defect-Centric Distribution of Channel Hot Carrier Degradation in Nano-MOSFETs

Border Traps in InGaAs nMOSFETs Assessed by Low-Frequency Noise

Impact of the Substrate Orientation on CHC Reliability in n-FinFETs&#x2014;Separation of the Various Contributions

Impact of the Substrate Orientation on CHC Reliability in n-FinFETs—Separation of the Various Contributions