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At-Speed Optimal Extended Symmetric BIRA to Repair Word-Oriented Memories

Type: Conference Paper

Author : Shahin, Khodadadi; Shahram, Khodadadi

Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

Type: Journal Paper

Author : Sanguhn Cha; Hongil Yoon

Publisher: IEEE

Year: 2014

Multi-objective optimization design of interior permanent-magnet synchronous motors for improving the effectiveness of field weakening control

Type: Conference Paper

Author : Ming-Tsung Chui; Jui-An Chiang; Jui-Min Lee; Zwe-Lee Gaing

Publisher: IEEE

Year: 2014

Author

Hongil Yoon (1)

Jui-An Chiang (1)

Jui-Min Lee (1)

Ming-Tsung Chui (1)

Sanguhn Cha (1)

Shahin, Khodadadi (1)

Shahram, Khodadadi (1)

Zwe-Lee Gaing (1)

Publisher

IEEE (2)

Year

2014 (2)

Keywords

Arrays (1)

Built-in redundancy analyser, built-in self-repair, word-oriented memory, Comprehensive Real-time ExhaustiveSearch Test and Analysis (CRESTA), extended symmetric BIRA (1)

built-in self test (1)

check bit arrays (1)

data bit arrays (1)

double adjacent error correction code (1)

Error correction code (1)

Error correction codes (1)

error correction codes (1)

fault model (1)

Type

Conference Paper (2)

Journal Paper (1)

Language (ISO)

English (2)

Farsi (1)

Content Type

Metadata Only (2)

Fulltext (1)

Publication Title

6th iranian conference on electrical and electronic engineering (1)

Device and Materials Reliability, IEEE Transactions on (1)

lectrical Machines and Systems (ICEMS), 2014 17th International Conference on (1)

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