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    Vacuum Steered-Electron Electric-Field Sensor 

    Type: Journal Paper
    Author : Williams, Kirt R.; De Bruyker, Dirk P. H.; Limb, Scott J.; Amendt, Eric M.; Overland, Doug /A/.
    Publisher: IEEE
    Year: 2014

    A Measurement System In Situ to Measure the Magnetic Field of an In-Vacuum Undulator 

    Type: Journal Paper
    Author : Chin-Kang Yang; Cheng-Hsing Chang; Jui-Che Huang; Ching-Shiang Hwang; Ting-Yi Chung
    Publisher: IEEE
    Year: 2014

    Design Assessments of a Rectangular DC Magnetron Sputter for Extended Target Life and Faster Sputtering 

    Type: Journal Paper
    Author : Cheng-Tsung Liu; Hsiao-Chun Yeh; He-Yu Chung; Chang-Chou Hwang
    Publisher: IEEE
    Year: 2014

    Electrical Behavior of an Ultralow-Energy Plasma-Focus Device 

    Type: Journal Paper
    Author : Barbaglia, Mario Oscar; Bruzzone, Horacio; Nestor Acuna, Hugo; Soto, Leopoldo; Clausse, Alejandro
    Publisher: IEEE
    Year: 2014

    Performance of a NSRRC In-Vacuum Undulator 

    Type: Journal Paper
    Author : Jui-Che Huang; Ling-Hui Wu; Chin-Kang Yang; Che-Ken Chuan; Ting-Yi Chung; Ching-Sheng Hwang
    Publisher: IEEE
    Year: 2014

    An evaluation procedure for estimating voltage ripple caused by cloud shadows moving over high-penetration PV distribution networks 

    Type: Conference Paper
    Author : Grady, W.M. , Thomas, H. , Razon, A.
    Publisher: IEEE
    Year: 2014

    Design and Evaluation of Automatic Agents for Stock Market Intraday Trading 

    Type: Conference Paper
    Author : Jabbur, E.; Silva, E.; Castilho, D.; Pereira, A.; Brandao, H.
    Publisher: IEEE
    Year: 2014

    Modeling and Simulated Fault Injection for Time-Triggered Safety-Critical Embedded Systems 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Diversity-Combining in asymmetrically clipped optical OFDM for PON IM/DD fiber link 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Investigating the inclinations of research and practices in Hadoop: A systematic review 

    Type: Conference Paper
    Author : Sharma, M.; Hasteer, N.; Tuli, A.; Bansal, A.
    Publisher: IEEE
    Year: 2014
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