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Now showing items 1-10 of 34
Universal relaxation characteristic of interface trap under FN and NBTI stress in pMOSFET device
Publisher: IET
Year: 2014
Rapid labelling of SCADA data to extract transparent rules using RIPPER
Publisher: IEEE
Year: 2014
Separation of Corner Component in TAT Mechanism in Retention Characteristics of Sub 20-nm NAND Flash Memory
Publisher: IEEE
Year: 2014
Payload minion stenographic technique for color images
Publisher: IEEE
Year: 2014
Motion Planning of Multi-docking System for Intelligent Mobile Robots
Publisher: IEEE
Year: 2014
Emulation at Very Large Scale with Distem
Publisher: IEEE
Year: 2014
Analysis of quality factor of quartz-crystal tuning fork fabricated by etching process
Publisher: IEEE
Year: 2014
New upper bounds for grain-correcting and grain-detecting codes
Publisher: IEEE
Year: 2014