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The knowledge base for computer-aided diagnosis of mental disorders based on psychometric tests

Type: Conference Paper

Author : Mich, O. , Burda, A. , Pancerz, K. , Gomula, J.

Publisher: IEEE

Year: 2014

Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay Test

Type: Journal Paper

Author : Mingjing Chen; Orailoglu, A.

Publisher: IEEE

Year: 2014

Parallelization of double higher order FEM and MoM techniques

Type: Conference Paper

Publisher: IEEE

Year: 2014

Improving Resilience to Timing Errors by Exposing Variability Effects to Software in Tightly-Coupled Processor Clusters

Type: Journal Paper

Author : Rahimi, Azar; Cesarini, Daniel; Marongiu, Andrea; Gupta, R.K.; Benini, Luca

Publisher: IEEE

Year: 2014

Author

Benini, Luca (1)

Cesarini, Daniel (1)

Gupta, R.K. (1)

Marongiu, Andrea (1)

Mich, O. , Burda, A. , Pancerz, K. , Gomula, J. (1)

Mingjing Chen (1)

Orailoglu, A. (1)

Rahimi, Azar (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

Delays (2)

Integrated circuit interconnections (2)

Inverters (2)

at-speed functional cycles (1)

at-speed testing techniques (1)

automatic test pattern generation (1)

Circuit faults (1)

circuit layout (1)

circuit level variability (1)

circuit robustness (1)

Type

Conference Paper (2)

Journal Paper (2)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

Emerging and Selected Topics in Circuits and Systems, IEEE Journal on (1)

igital Technologies (DT), 2014 10th International Conference on (1)

ntennas and Propagation Society International Symposium (APSURSI), 2014 IEEE (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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