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    Proposed Method for Multimedia Data Security Using Cyclic Elliptic Curve, Chaotic System, and Authentication Using Neural Network 

    Type: Conference Paper
    Author : Baheti, A. , Singh, L. , Khan, A.U.
    Publisher: IEEE
    Year: 2014

    Overview of IEEE Std 1564-2014 Guide for Voltage Sag Indices 

    Type: Conference Paper
    Author : Sabin, D.D. , Bollen, M.H.J.
    Publisher: IEEE
    Year: 2014

    Parallel algorithm of the hybrid methods for the solution of 3D electromagnetic propagation 

    Type: Conference Paper
    Author : Shen, Yuewei; Zhang, Lin; Wu, Yingnian; Wu, Yingnian
    Publisher: IEEE
    Year: 2014

    Difficulties, attitudes and misconceptions on experimenting with optimization algorithms 

    Type: Conference Paper
    Author : Velazquez-Iturbide, J.A.
    Publisher: IEEE
    Year: 2014

    Nano warehouse: A new concept for grain storage in India 

    Type: Conference Paper
    Author : Singh, D.K.; Desai, R.; Walde, N.; Karandikar, P.B.
    Publisher: IEEE
    Year: 2014

    Atmospheric Pressure RF Discharge in Neon and Helium 

    Type: Journal Paper
    Author : Josepson, Raavo; Navrá til, Zdené k; Dosoudilová , Lenka; Dvorá k, Pavel; Trunec, David
    Publisher: IEEE
    Year: 2014

    Microdischarge Ignition in Liquid Heptane 

    Type: Journal Paper
    Author : Hamdan, Ahmad; Marinov, Ilya; Rousseau, Alain; Belmonte, Thierry
    Publisher: IEEE
    Year: 2014

    Fidelity of a Time-Resolved Imaging Diagnostic for Electron Beam Profiles 

    Type: Journal Paper
    Author : Frayer, Daniel; Ekdahl, C.A.; Johnson, D.
    Publisher: IEEE
    Year: 2014

    Schlieren Imaging of Shock-Wave Formation Induced by Ultrafast Heating of a Nanosecond Repetitively Pulsed Discharge in Air 

    Type: Journal Paper
    Author : Xu, Da /A/.; Lacoste, Deanna /A/.; Laux, Christophe O.
    Publisher: IEEE
    Year: 2014

    Propagation of a Dielectric Barrier Discharge in a Multichannel Mixing Chip Microreactor 

    Type: Journal Paper
    Author : Stauss, Sven; Ishii, Chikako; Kuribara, Koichi; Urabe, Keiichiro; Terashima, K.
    Publisher: IEEE
    Year: 2014
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