Search

Now showing items 1-10 of 125

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Type: Journal Paper

Author : Janicki, Jakub; Kassab, M.; Mrugalski, Grzegorz; Mukherjee, Nandini; Rajski, J.; Tyszer, J.

Publisher: IEEE

Year: 2014

[Copyright notice]

Type: Conference Paper

Publisher: IEEE

Year: 2014

Built-In EVM Measurement With Negligible Hardware Overhead

Type: Journal Paper

Author : Yilmaz, Ender; Nassery, Afsaneh; Ozev, Sule

Publisher: IEEE

Year: 2014

Bob Meyer's Impact in Industry

Type: Journal Paper

Author : Mack, William D.

Publisher: IEEE

Year: 2014

Enhancement of radio frequency device's contact test using a novel method

Type: Journal Paper

Author : Cheng-Nan Hu; Wen-Ju Chen; Hsuan-Chung Ko

Publisher: IET

Year: 2014

Utilizing ATE Vector Repeat With Linear Decompressor for Test Vector Compression

Type: Journal Paper

Author : Joon-Sung Yang; Jinkyu Lee; Touba, Nur /A/.

Publisher: IEEE

Year: 2014

User-driven refinement of imprecise queries

Type: Conference Paper

Author : Qarabaqi, B.

Publisher: IEEE

Year: 2014

Semantic pattern analysis for verbal fluency based assessment of neurological disorders

Type: Conference Paper

Publisher: IEEE

Year: 2014

Measurement-based study of the performance of IEEE 802.11ac in an indoor environment

Type: Conference Paper

Author : Dianu, M.-D. , Riihijarvi, J. , Petrova, M.

Publisher: IEEE

Year: 2014

Cooperative multi-cell MIMO downlink precoding for finite-alphabet inputs

Type: Conference Paper

Author : Wenhao Wu , Kun Wang , Zhi Ding , Chengshan Xiao

Publisher: IEEE

Year: 2014

1
2
3
4
. . .
13

Search

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

[Copyright notice]

Built-In EVM Measurement With Negligible Hardware Overhead

Bob Meyer's Impact in Industry

Enhancement of radio frequency device's contact test using a novel method

Utilizing ATE Vector Repeat With Linear Decompressor for Test Vector Compression

User-driven refinement of imprecise queries

Semantic pattern analysis for verbal fluency based assessment of neurological disorders

Measurement-based study of the performance of IEEE 802.11ac in an indoor environment

Cooperative multi-cell MIMO downlink precoding for finite-alphabet inputs

Author

Publisher

Year

Keywords

Type

Language (ISO)

Content Type

Publication Title

Search

Filters

Erratum to &#x201C;Test Time Reduction in EDT Bandwidth Management for SoC Designs&#x201D; [Nov 13 1776-1786]

[Copyright notice]

Built-In EVM Measurement With Negligible Hardware Overhead

Bob Meyer's Impact in Industry

Enhancement of radio frequency device's contact test using a novel method

Utilizing ATE Vector Repeat With Linear Decompressor for Test Vector Compression

User-driven refinement of imprecise queries

Semantic pattern analysis for verbal fluency based assessment of neurological disorders

Measurement-based study of the performance of IEEE 802.11ac in an indoor environment

Cooperative multi-cell MIMO downlink precoding for finite-alphabet inputs

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]