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Considerations in the design of a boundary scan runtime library

Type: Journal Paper

Author : Borroz, Terry

Publisher: IEEE

Year: 2014

Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs

Type: Journal Paper

Author : Ran Wang; Chakrabarty, Krishnendu; Eklow, Bill

Publisher: IEEE

Year: 2014

Author

Borroz, Terry (1)

Chakrabarty, Krishnendu (1)

Eklow, Bill (1)

Ran Wang (1)

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IEEE (2)

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2014 (2)

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boundary scan testing (2)

integrated circuit testing (2)

2.5-D ICs (1)

2.5-D integration (1)

Boundary conditions (1)

boundary scan runtime library design (1)

circuit simulation (1)

Clocks (1)

Computer architecture (1)

data communication (1)

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Journal Paper (2)

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English (2)

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Metadata Only (2)

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on (1)

Instrumentation &amp; Measurement Magazine, IEEE (1)

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