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    Degradations of Threshold Voltage, Mobility, and Drain Current and the Dependence on Transistor Geometry For Stressing at 77 K and 300 K 

    Type: Journal Paper
    Author : Guoying Wu; Deptuch, Grzegorz W.; Hoff, Jim R.; Ping Gui
    Publisher: IEEE
    Year: 2014

    Kinetic Monte Carlo Simulations of <formula formulatype="inline"> <img src="/images/tex/21436.gif" alt="M!!-!!H"> </formula> Loops for HAMR Recording Media: Comparison With MOKE Data 

    Type: Journal Paper
    Author : Plumer, M.L.; Fal, T.J.; Mercer, J.I.; Whitehead, J.P.; van Ek, J.; Ajan, Antony
    Publisher: IEEE
    Year: 2014

    Performance Enhancement on an InGaP/InGaAs PHEMT With an Electrophoretic Deposition Gate Structure 

    Type: Journal Paper
    Author : Chun-Chia Chen; Huey-Ing Chen; Po-Cheng Chou; Jian-Kai Liou; Yung-Jen Chiou; Jung-Hui Tsai; Wen-Chau Liu
    Publisher: IEEE
    Year: 2014

    Magnetic Properties of Hot-Pressed <inline-formula> <img src="/images/tex/21625.gif" alt="{\\rm FeSb}_{{2}}"> </inline-formula> 

    Type: Journal Paper
    Author : Pokharel, Mani; Huaizhou Zhao; Modic, Kimberly /A/.; Zhifeng Ren; Opeil, Cyril
    Publisher: IEEE
    Year: 2014

    A Monolithic Polyimide Micro Cryogenic Cooler: Design, Fabrication, and Test 

    Type: Journal Paper
    Author : Yunda Wang; Lewis, R.; Radebaugh, R.; Lin, Martin M.-H; Bright, V.M.; Yung-Cheng Lee
    Publisher: IEEE
    Year: 2014

    AlN/AlGaN HEMTs on AlN substrate for stable high-temperature operation 

    Type: Journal Paper
    Author : Yafune, N.; Hashimoto, Shuji; Akita, K.; Yamamoto, Yusaku; Tokuda, Hirokuni; Kuzuhara, Masaaki
    Publisher: IET
    Year: 2014

    FINA 2014 Organizing Committee and Reviewers 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Amperometric detection of organophosphate and carbamate pesticides Based on AuNPs/graphene-PEDOT:PSS nanocomposites modified electrode 

    Type: Conference Paper
    Author : Sansuk, M.; Sritongkham, P.
    Publisher: IEEE
    Year: 2014

    Prediction of critical dielectric strength of hot CF<sub>4</sub> gas in the temperature range of 300-3500 K 

    Type: Journal Paper
    Author : Wu, Yaowu; Wang, W.; Rong, M.; Zhong, L.L.; Spencer, Joseph W.; Yan, J.D.
    Publisher: IEEE
    Year: 2014

    Thermionic-Field Emission Barrier Between Nanocrystalline Diamond and Epitaxial 4H-SiC 

    Type: Journal Paper
    Author : Tadjer, Marko J.; Hobart, Karl D.; Anderson, Travis J.; Feygelson, Tatyana /I/.; Myers-Ward, Rachael L.; Koehler, Andrew D.; Calle, F.; Eddy, Charles R.; Gaskill, D. Kurt; Pate, Bradford B.; Kub, Francis J.
    Publisher: IEEE
    Year: 2014
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