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    Characterization of the Proximity Effect From Tungsten TSVs on 130-nm CMOS Devices in 3-D ICs 

    Type: Journal Paper
    Author : Sangwook Han; Wentzloff, David D.
    Publisher: IEEE
    Year: 2014

    Post-Silicon Characterization and On-Line Prediction of Transient Thermal Field in Integrated Circuits Using Thermal System Identification 

    Type: Journal Paper
    Author : Minki Cho; Ahmed, Khondker Zakir; Song, William J.; Yalamanchili, Sudhakar; Mukhopadhyay, Saibal
    Publisher: IEEE
    Year: 2014

    Polar Quantizer for Wireless Receivers: Theory, Analysis, and CMOS Implementation 

    Type: Journal Paper
    Author : Nazari, Peyman; Byung-Kwan Chun; Tzeng, Fred; Heydari, Payam
    Publisher: IEEE
    Year: 2014

    A 60-dB Gain OTA Operating at 0.25-V Power Supply in 130-nm Digital CMOS Process 

    Type: Journal Paper
    Author : Ferreira, Luis H. C.; Sonkusale, Sameer R.
    Publisher: IEEE
    Year: 2014

    Resilient Pipeline Under Supply Noise With Programmable Time Borrowing and Delayed Clock Gating 

    Type: Journal Paper
    Author : Kwanyeob Chae; Mukhopadhyay, Saibal
    Publisher: IEEE
    Year: 2014

    DSP aided chromatic dispersion reckoning in single carrier high speed coherent optical communications 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    The energy benefit of level-crossing sampling including the actuator's energy consumption 

    Type: Conference Paper
    Author : Hensel, B. , Kabitzsch, K.
    Publisher: IEEE
    Year: 2014

    Complementary resistive switch based stateful logic operations using material implication 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Symmetric Coherent Link Degree, Adaptive Throughput-Transmission Power for Wireless Sensor Networks 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Multilevel descriptive experiment design regularization framework for sparsity preserving enhancement of radar imagery in harsh sensing environments 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014
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