Search

Now showing items 1-7 of 7

Validation of the Variable Depth Bragg Peak Method for Single-Event Latchup Testing Using Ion Beam Characterization

Type: Journal Paper

Author : Roche, Nicholas J.-H; Buchner, Stephen P.; Foster, C.C.; King, Michael P.; Dodds, Nathaniel /A/.; Warner, Jeffrey H.; McMorrow, Dale; Decker, T.; OaNeill, P.M.; Reddell, B.D.; Nguyen, K.V.; Samsel, I.K.; Hooten, N.C.; Bennett, W.G.; Reed, R.A.

Publisher: IEEE

Year: 2014

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

Type: Journal Paper

Author : Alia, R. Garcia; Blackmore, Ewart W.; Brugger, M.; Danzeca, S.; Ferlet-Cavrois, Veronique; Gaillard, R.; Mekki, J.; Poivey, C.; Roed, Ketil; Saigne, F.; Spiezia, G.; Trinczek, Michael; Uznanski, Slawosz; Wrobel, F.

Publisher: IEEE

Year: 2014

Multiple Cell Upset Classification<newline/> in Commercial SRAMs

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Todri, A.; Virazel, A.; Puchner, H.; Frost, Christopher; Wrobel, F.; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

Radiation Hardening of an SiGe BiCMOS Wilkinson ADC for Distributed Motor Controller Application

Type: Journal Paper

Author : Adell, P.C.; Yager, Jeremy; Pannell, Zack; Shelton, Joseph; Mojarradi, M.M.; Blalock, Benjamin J.; Allen, G.; Some, R.

Publisher: IEEE

Year: 2014

Energy Dependence of Tungsten-Dominated SEL Cross Sections

Type: Journal Paper

Author : Alia, R. Garcia; Brugger, M.; Danzeca, S.; Ferlet-Cavrois, Veronique; Poivey, C.; Roed, Ketil; Saigne, F.; Spiezia, G.; Uznanski, Slawosz; Saigne, F.

Publisher: IEEE

Year: 2014

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; Cocquerez, P.; Autran, J.L.; Litterio, A.; Wrobel, F.; Saigne, F.

Publisher: IEEE

Year: 2014

Exploring Well-Configurations for Minimizing Single Event Latchup

Type: Journal Paper

Author : Uemura, Toshifumi; Kato, Toshihiko; Tanabe, Ryo; Iwata, Hiroshi; Ariyoshi, Junichi; Matsuyama, Hiroki; Hashimoto, Mime

Publisher: IEEE

Year: 2014

Search

Validation of the Variable Depth Bragg Peak Method for Single-Event Latchup Testing Using Ion Beam Characterization

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

Multiple Cell Upset Classification<newline/> in Commercial SRAMs

Radiation Hardening of an SiGe BiCMOS Wilkinson ADC for Distributed Motor Controller Application

Energy Dependence of Tungsten-Dominated SEL Cross Sections

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Exploring Well-Configurations for Minimizing Single Event Latchup

Author

Publisher

Year

Keywords

Type

Language (ISO)

Content Type

Publication Title

Search

Filters

Validation of the Variable Depth Bragg Peak Method for Single-Event Latchup Testing Using Ion Beam Characterization

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

Multiple Cell Upset Classification<newline/> in Commercial SRAMs

Radiation Hardening of an SiGe BiCMOS Wilkinson ADC for Distributed Motor Controller Application

Energy Dependence of Tungsten-Dominated SEL Cross Sections

90&#x00A0;nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Exploring Well-Configurations for Minimizing Single Event Latchup

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica