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Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States

Type: Journal Paper

Author : Pomeranz, Irith

Publisher: IEEE

Year: 2014

Test Compaction by Sharing of Transparent-Scan Sequences Among Logic Blocks

Type: Journal Paper

Author : Pomeranz, Irith

Publisher: IEEE

Year: 2014

Emotional healthcare system: Emotion detection by facial expressions using Japanese database

Type: Conference Paper

Author : Tivatansakul, Somchanok; Ohkura, Michiko; Puangpontip, Supadchaya; Achalakul, Tiranee

Publisher: IEEE

Year: 2014

Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs

Type: Journal Paper

Author : Ran Wang; Chakrabarty, Krishnendu; Eklow, Bill

Publisher: IEEE

Year: 2014

Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing

Type: Journal Paper

Author : Yi-Hua Li; Wei-Cheng Lien; Ing-Chao Lin; Kuen-Jong Lee

Publisher: IEEE

Year: 2014

Author

Pomeranz, Irith (2)

Achalakul, Tiranee (1)

Chakrabarty, Krishnendu (1)

Eklow, Bill (1)

Ing-Chao Lin (1)

Kuen-Jong Lee (1)

Ohkura, Michiko (1)

Puangpontip, Supadchaya (1)

Ran Wang (1)

Tivatansakul, Somchanok (1)

Publisher

IEEE (5)

Year

2014 (5)

Keywords

Clocks (3)

integrated circuit testing (3)

boundary scan testing (2)

Circuit faults (2)

fault diagnosis (2)

logic testing (2)

2.5-D ICs (1)

2.5-D integration (1)

89 benchmark circuits (1)

99 benchmark circuits (1)

Type

Journal Paper (4)

Conference Paper (1)

Language (ISO)

English (5)

Content Type

Metadata Only (5)

Publication Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on (3)

omputer Science and Electronic Engineering Conference (CEEC), 2014 6th (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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