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    Fast mix 

    Type: Journal Paper
    Publisher: Bell Publishing Ltd.
    Year: 2014

    Optical damage tests on reflecting materials for solar applications 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    A noise-robust radar target classification method based on complex probabilistic principal component analysis 

    Type: Conference Paper
    Author : Lan Du; Linsen Li; Yanyan Ma; Baoshuai Wang; Hongwei Liu
    Publisher: IEEE
    Year: 2014

    Rinaldo Castello and the Analog-Design Environment in Pavia: A Success Story 

    Type: Journal Paper
    Author : Baccarani, G.
    Publisher: IEEE
    Year: 2014

    High-efficiency large area ion-implanted n-type front junction Si solar cells with screen-printed contacts and SiO<inf>2</inf> passivated boron emitters 

    Type: Conference Paper
    Author : Yuguo Tao; Rohatgi, A.
    Publisher: IEEE
    Year: 2014

    A Quality Flow Model in Battery Manufacturing Systems for Electric Vehicles 

    Type: Journal Paper
    Author : Feng Ju; Jingshan Li; Guoxian Xiao; Ningjian Huang; Biller, Stephan
    Publisher: IEEE
    Year: 2014

    Effective Quality Management: Value- and Risk-Based Software Quality Management 

    Type: Journal Paper
    Author : Poth, Alexander; Sunyaev, Ali
    Publisher: IEEE
    Year: 2014

    Optimal design of interior permanent magnet synchronous motor considering the manufacturing tolerances using Taguchi robust design 

    Type: Journal Paper
    Author : Sujin Lee; Kyuseob Kim; Sugil Cho; Junyong Jang; Taehee Lee; Jungpyo Hong
    Publisher: IET
    Year: 2014

    Data-Driven Soft-Sensor Modeling for Product Quality Estimation Using Case-Based Reasoning and Fuzzy-Similarity Rough Sets 

    Type: Journal Paper
    Author : Ping Zhou; Shao-Wen Lu; Tianyou Chai
    Publisher: IEEE
    Year: 2014

    Metamaterials strongly coupled to intersubband transitions: Circuit model and second order nonlinear processes 

    Type: Conference Paper
    Author : Campione, Salvatore; Benz, Alexander; Wolf, Omri; Klem, John F.; Capolino, Filippo; Sinclair, Michael B.; Brener, Igal
    Publisher: IEEE
    Year: 2014
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