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Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

Type: Journal Paper

Author : Privat, A.; Touboul, A.D.; Petit, Marc; Huselstein, J.J.; Wrobel, F.; Forest, Francois; Vaillé , J.R.; Bourdarie, S.; Arinero, R.; Chatry, N.; Chaumont, G.; Lorfè vre, E.; Saigné , Fré dé ric

Publisher: IEEE

Year: 2014

Voltage rise impacts and generation modeling of residential roof-top photo-voltaic systems

Type: Conference Paper

Author : Wong, P.K.C. , Barr, R.A. , Kalam, A.

Publisher: IEEE

Year: 2014

Poster abstract: Static analysis of device drivers in TinyOS

Type: Conference Paper

Publisher: IEEE

Year: 2014

Analysis and detection of low quality information in social networks

Type: Conference Paper

Author : De Wang

Publisher: IEEE

Year: 2014

Using Probabilistic Graphical Models to Enhance the Prognosis of Health-Related Quality of Life in Adult Survivors of Critical Illness

Type: Conference Paper

Publisher: IEEE

Year: 2014

Study of the combined impact of auto-consumption behaviour and correlation level between prosumers on overvoltage probabilities in low voltage distribution grids

Type: Conference Paper

Author : Vallee, F. , Klonari, V. , Lobry, J. , Durieux, O.

Publisher: IEEE

Year: 2014

Temperature Sensing for Power MOSFETs in Short-Duration Avalanche Mode

Type: Journal Paper

Author : Azoui, Toufik; Tounsi, Patrick; Pasquet, G.; Reynes, Jean-Michel; Pomes, Emilie; Dorkel, Jean-Marie

Publisher: IEEE

Year: 2014

Monolithically Integrated Temperature Sensor in Silicon Carbide Power MOSFETs

Type: Journal Paper

Author : Berthou, Maxime; Godignon, P.; Millan, James

Publisher: IEEE

Year: 2014

[Front cover]

Type: Conference Paper

Publisher: IEEE

Year: 2014

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Type: Journal Paper

Author : Privat, A.; Touboul, A.D.; Michez, A.; Bourdarie, S.; Vaille, J.R.; Wrobel, F.; Chatry, N.; Chaumont, G.; Lorfevre, E.; Bezerra, F.; Saigne, F.

Publisher: IEEE

Year: 2014

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Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

Voltage rise impacts and generation modeling of residential roof-top photo-voltaic systems

Poster abstract: Static analysis of device drivers in TinyOS

Analysis and detection of low quality information in social networks

Using Probabilistic Graphical Models to Enhance the Prognosis of Health-Related Quality of Life in Adult Survivors of Critical Illness

Study of the combined impact of auto-consumption behaviour and correlation level between prosumers on overvoltage probabilities in low voltage distribution grids

Temperature Sensing for Power MOSFETs in Short-Duration Avalanche Mode

Monolithically Integrated Temperature Sensor in Silicon Carbide Power MOSFETs

[Front cover]

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

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Impact of Single Event Gate Rupture and Latent Defects on Power MOSFETs Switching Operation

Voltage rise impacts and generation modeling of residential roof-top photo-voltaic systems

Poster abstract: Static analysis of device drivers in TinyOS

Analysis and detection of low quality information in social networks

Using Probabilistic Graphical Models to Enhance the Prognosis of Health-Related Quality of Life in Adult Survivors of Critical Illness

Study of the combined impact of auto-consumption behaviour and correlation level between prosumers on overvoltage probabilities in low voltage distribution grids

Temperature Sensing for Power MOSFETs in Short-Duration Avalanche Mode

Monolithically Integrated Temperature Sensor in Silicon Carbide Power MOSFETs

[Front cover]

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination