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New Criteria for Global Robust Stability of Delayed Neural Networks With Norm-Bounded Uncertainties

Type: Journal Paper

Author : Arik, Sabri

Publisher: IEEE

Year: 2014

Automatic Test Data Generation for Unit Testing to Achieve MC/DC Criterion

Type: Conference Paper

Author : Tianyong Wu , Jun Yan , Jian Zhang

Publisher: IEEE

Year: 2014

Dear Colleagues [Welcome message]

Type: Conference Paper

Author : Egorov, N.

Publisher: IEEE

Year: 2014

[Front cover]

Type: Conference Paper

Publisher: IEEE

Year: 2014

Investigation and design of the efficient hardware-based RNG for cryptographic applications

Type: Conference Paper

Author : Razy, A.F.M.; Naziri, S.Z.M.; Ismail, R.C.; Idris, N.

Publisher: IEEE

Year: 2014

Robust H<sup>∞</sup> static output control of discrete Markov jump linear systems with norm bounded uncertainties

Type: Journal Paper

Author : Mouquan Shen; Dan Ye; Shuimin Fei

Publisher: IET

Year: 2014

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New Criteria for Global Robust Stability of Delayed Neural Networks With Norm-Bounded Uncertainties

Automatic Test Data Generation for Unit Testing to Achieve MC/DC Criterion

Dear Colleagues [Welcome message]

[Front cover]

Investigation and design of the efficient hardware-based RNG for cryptographic applications

Robust H<sup>∞</sup> static output control of discrete Markov jump linear systems with norm bounded uncertainties

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New Criteria for Global Robust Stability of Delayed Neural Networks With Norm-Bounded Uncertainties

Automatic Test Data Generation for Unit Testing to Achieve MC/DC Criterion

Dear Colleagues [Welcome message]

[Front cover]

Investigation and design of the efficient hardware-based RNG for cryptographic applications

Robust H<sup>&#x0221E;</sup> static output control of discrete Markov jump linear systems with norm bounded uncertainties

Robust H<sup>∞</sup> static output control of discrete Markov jump linear systems with norm bounded uncertainties