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RISImpacts of NBTI/PBTI on performance of domino logic circuits with high-k metal-gate devices in nanoscale CMOS
Year: 2012
Abstract:
Negative-bias temperature instability (NBTI) and positive-bias temperature instability (PBTI) weaken
PFETs and high-k metal-gate NFETs, respectively. This paper provides comprehensive analyses on the
impacts of NBTI and PBTI on wide...
Analyzing sentimental influence of posts on social networks
Publisher: IEEE
Year: 2014
Impact of NBTI on performance of domino logic circuits in nano-scale CMOS
Year: 2011
Abstract:
Negative Bias Temperature Instability (NBTI) in pMOS transistors has become a major reliability
concern in the state-of-the art digital circuit design. This paper discusses the effects of NBTI on 32 nm
technology high fan-in dynamic...
Threshold voltage instability mechanisms of nitride based charge trap flash memory A review
Publisher: American Scientific Publishers
Year: 2014
Universal relaxation characteristic of interface trap under FN and NBTI stress in pMOSFET device
Publisher: IET
Year: 2014
Energy/Lifetime Cooptimization by Cache Partitioning With Graceful Performance Degradation
Publisher: IEEE
Year: 2014
Asymmetric Aging: Introduction and Solution for Power-Managed Mixed-Signal SoCs
Publisher: IEEE
Year: 2014
NBTI and Leakage Reduction Using ILP-Based Approach
Publisher: IEEE
Year: 2014
A Detailed Study of Gate Insulator Process Dependence of NBTI Using a Compact Model
Publisher: IEEE
Year: 2014
Dynamic Indexing: Leakage-Aging Co-Optimization for Caches
Publisher: IEEE
Year: 2014