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Upgrade test capability for ±800kV/6250A and ±1100kV/5454A UHVDC valve

Type: Conference Paper

Author : Gao, Ch.; Zha, K.P.; Tang, G.F.; Wang, X.H.; Wang, G.Y.; Zhou, J.C.

Publisher: IEEE

Year: 2014

Fault resilient physical neural networks on a single chip

Type: Conference Paper

Author : Shi, Weidong; Wen, Yuanfeng; Liu, Ziyi; Zhao, Xi; Boumber, Dainis; Vilalta, Ricardo; Xu, Lei

Publisher: IEEE

Year: 2014

Author

Boumber, Dainis (1)

Gao, Ch. (1)

Liu, Ziyi (1)

Shi, Weidong (1)

Tang, G.F. (1)

Vilalta, Ricardo (1)

Wang, G.Y. (1)

Wang, X.H. (1)

Wen, Yuanfeng (1)

Xu, Lei (1)

Publisher

IEEE (2)

Year

2014 (2)

Keywords

n impedance variations (2)

ageing (1)

database management systems (1)

n condition monitoring (1)

n conductive nonmagnetic plate (1)

n cross validation (1)

n eddy current testing (1)

n electrical engineering computing (1)

n FEM (1)

n finite element analysis (1)

Type

Conference Paper (2)

Language (ISO)

English (2)

Content Type

Metadata Only (2)

Publication Title

ompilers, Architecture and Synthesis for Embedded Systems (CASES), 2014 International Conference on (1)

ower System Technology (POWERCON), 2014 International Conference on (1)

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