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Simulation research on surface charging phenomena across solid dielectrics prior to flashover in vacuum
Publisher: IEEE
Year: 2014
Passivation of SiO<inf>2</inf>/SiC interface with La<inf>2</inf>O<inf>3</inf> capped oxidation
Publisher: IEEE
Year: 2014
TCAD analysis of HCS degradation in LDMOS devices under AC stress conditions
Publisher: IEEE
Year: 2014
QBROKAGE: A Genetic Approach for QoS Cloud Brokering
Publisher: IEEE
Year: 2014