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    Optimization of feature selection method for high dimensional data using fisher score and minimum spanning tree 

    Type: Conference Paper
    Author : Singh, Bharat; Sankhwar, Jitendra Singh; Vyas, Om Prakash
    Publisher: IEEE
    Year: 2014

    EM-based ML channel estimation in OFDM systems with phase distortion using RB-EKF 

    Type: Conference Paper
    Author : Carvajal, R.; Godoy, B.I.; Aguero, J.C.; Yuz, J.I.; Creixell, W.
    Publisher: IEEE
    Year: 2014

    Prediction of spatial patterns of urban dynamics in Pune, India 

    Type: Conference Paper
    Author : Aithal, Bharath.H.; Vinay S; Venugopal Rao K.; Ramachandra T.V.
    Publisher: IEEE
    Year: 2014

    Linearity and analog performance analysis in GSDG-MOSFET with gate and channel engineering 

    Type: Conference Paper
    Author : Mohapatra, S.K.; Pradhan, K.P.; Sahu, P.K
    Publisher: IEEE
    Year: 2014

    Defect detection of steel surface using entropy segmentation 

    Type: Conference Paper
    Author : Nand, Gagan Kishore; Noopur; Neogi, Nirbhar
    Publisher: IEEE
    Year: 2014

    Impact of wavelets and filter on vibration-based mechanical rub detection using Neural Networks 

    Type: Conference Paper
    Author : Roy, Souptik Dutta; Shome, Saikat Kumar; Laha, Swarup K.
    Publisher: IEEE
    Year: 2014

    Towards CIM implementation challenges in control centers worldwide and Indian power grid 

    Type: Conference Paper
    Author : Ravikumar, Gelli; Khaparde, S.A.; Joshi, Rushikesh K.
    Publisher: IEEE
    Year: 2014

    Timing correlation between clock & data strobe with dynamic rank switching in DDR3 RDIMMs 

    Type: Conference Paper
    Author : Lingambudi, Anil; Wright, Kenneth; Zevin, William; Sethuraman, Saravanan; Saurabh, Abhijit; Pullelli, Sivaram; Vijay, Siddharth
    Publisher: IEEE
    Year: 2014

    Low-cost hierarchical memory-based pipelined architecture for DNA sequence matching 

    Type: Conference Paper
    Author : Ray, Sanchita Saha; Ghosh, Surajeet; Prasad, Rakesh
    Publisher: IEEE
    Year: 2014

    Risk-based security assessment considering corrective control of TCSC devices 

    Type: Conference Paper
    Author : Shi, P.; Wen, Y.; Yan, Z.; Qian, J.; Deng, M.; Guo, C.
    Publisher: IEEE
    Year: 2014
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