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Security risk modelling using SecureUML

Type: Conference Paper

Author : Chowdhury, Mohammad Jabed Morshed

Publisher: IEEE

Year: 2014

[Front cover]

Type: Conference Paper

Publisher: IEEE

Year: 2014

Low cost implicit built-in self-test of passive RFID Tags

Type: Conference Paper

Author : Banerjee, Suvadeep; Banerjee, Debashis; Banerjee, Aritra; Kyujeong Lee; Chatterjee, Abhijit

Publisher: IEEE

Year: 2014

Bangladeshi style: A way of facial artistic stylization in visual effects

Type: Conference Paper

Author : Azad, Md.Abul Kalam; Xie, Ning; Ahmad, Shamim

Publisher: IEEE

Year: 2014

An electro-chemical test and optimization system for impressed current cathodic corrosion protection

Type: Conference Paper

Author : Andre Chang, A.; Patel, Jasbir N.; Shahbazbegian, Haleh; Kaminska, Bozena

Publisher: IEEE

Year: 2014

Optimization of tag anti-collision algorithm for EPC Gen2 RFID

Type: Conference Paper

Author : Cerciello, Eleonora; Massei, Gianluca; Paura, Luigi

Publisher: IEEE

Year: 2014

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Security risk modelling using SecureUML

[Front cover]

Low cost implicit built-in self-test of passive RFID Tags

Bangladeshi style: A way of facial artistic stylization in visual effects

An electro-chemical test and optimization system for impressed current cathodic corrosion protection

Optimization of tag anti-collision algorithm for EPC Gen2 RFID

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Security risk modelling using SecureUML

[Front cover]

Low cost implicit built-in self-test of passive RFID Tags

Bangladeshi style: A way of facial artistic stylization in visual effects

An electro-chemical test and optimization system for impressed current cathodic corrosion protection

Optimization of tag anti-collision algorithm for EPC Gen2 RFID