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    ITE EMC requirements in BRIC countries: EMC compliance in Brazil, Russia, India, and China 

    Type: Conference Paper
    Author : Maynard, Mark
    Publisher: IEEE
    Year: 2014

    Incorporating world information into the IMM algorithm via state-dependent value assignment 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Electrical safety myths and facts 2 

    Type: Conference Paper
    Author : White, J.R.
    Publisher: IEEE
    Year: 2014

    On the Computation of the Higher Order Statistics of the Channel Capacity for Amplify-and-Forward Multihop Transmission 

    Type: Journal Paper
    Author : Yilmaz, Ferkan; Tabassum, Hina; Alouini, Mohamed-Slim
    Publisher: IEEE
    Year: 2014

    Study of AsH<inf>3</inf> Plasma Immersion Ion Implantation using PULSION<sup>&#x00AE;</sup> 

    Type: Conference Paper
    Author : Duchaine, J.; Torregrosa, F.; Spiegel, Y.; Borvon, G.; Shu Qin; Yongjun Jeff Hu; McTeer, A.
    Publisher: IEEE
    Year: 2014

    New proposals about evaluation of complete e-learning course digestion 

    Type: Conference Paper
    Author : Eremin, Evgeny A.
    Publisher: IEEE
    Year: 2014

    QoF: Towards Comprehensive Path Quality Measurement in Wireless Sensor Networks 

    Type: Journal Paper
    Author : Jiliang Wang; Yunhao Liu; Yuan He; Wei Dong; Mo Li
    Publisher: IEEE
    Year: 2014

    A novel calibration algorithm with auxiliary signal source for sensor array errors 

    Type: Conference Paper
    Author : Ren, Kaiqiang; Deng, Bing
    Publisher: IEEE
    Year: 2014

    Performance Analysis of Multi-Hop Amplify-and-Forward Relaying Systems in Rayleigh Fading Channels with a Poisson Interference Field 

    Type: Journal Paper
    Author : Aalo, Valentine /A/.; Efthymoglou, George P.; Soithong, Termpong; Alwakeel, Mohammed; Alwakeel, Sami
    Publisher: IEEE
    Year: 2014

    Delay Characterization of Multihop Transmission in a Poisson Field of Interference 

    Type: Journal Paper
    Author : Stamatiou, Kostas; Haenggi, Martin
    Publisher: IEEE
    Year: 2014
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