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ICT supported laboratory testing of installation circuit breaker

Type: Conference Paper

Author : Gadž e, D. , Puzak, M. , Haldek, D.

Publisher: IEEE

Year: 2014

Analytical 2-D slot model for predicting AC losses in bar-wound machine windings due to armature reaction

Type: Conference Paper

Author : Wanjun Zhang , Jahns, T.M.

Publisher: IEEE

Year: 2014

3-D ghost imaging with microwave radar

Type: Conference Paper

Author : Xu, Ran; Li, Yachao; Xing, Mengdao; Shao, Peng

Publisher: IEEE

Year: 2014

A Low-Power HKMG CMOS Platform Compatible With Dram Node 2× and Beyond

Type: Journal Paper

Author : Ritzenthaler, R.; Schram, T.; Spessot, A.; Caillat, Christian; Aoulaiche, Marc; Moon Ju Cho; Kyoung Bong Noh; Son, Yeongrack; Hoon Joo Na; Kauerauf, T.; Douhard, B.; Nazir, A.; Soon Aik Chew; Milenin, A.P.; Altamirano-Sanchez, E.; Schoofs, Geert; Albert, J.; Sebai, Farid; Vecchio, Emma; Paraschiv, V.; Vandervorst, W.; Sun-Ghil Lee; Collaert, Nadine; Fazan, P.; Horiguchi, Naoto; Thean, Aaron Voon-Yew

Publisher: IEEE

Year: 2014

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ICT supported laboratory testing of installation circuit breaker

Analytical 2-D slot model for predicting AC losses in bar-wound machine windings due to armature reaction

3-D ghost imaging with microwave radar

A Low-Power HKMG CMOS Platform Compatible With Dram Node 2× and Beyond

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ICT supported laboratory testing of installation circuit breaker

Analytical 2-D slot model for predicting AC losses in bar-wound machine windings due to armature reaction

3-D ghost imaging with microwave radar

A Low-Power HKMG CMOS Platform Compatible With Dram Node 2&#x00D7; and Beyond

A Low-Power HKMG CMOS Platform Compatible With Dram Node 2× and Beyond