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Analytical averaged loss model of a three-level T-type converter
Publisher: IEEE
Year: 2014
Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits
Publisher: IEEE
Year: 2014
Dynamic Deformation Analysis of Power Transformer Windings in Short-Circuit Fault by FEM
Publisher: IEEE
Year: 2014
Effects of Manufacturing Imperfections in Concentrated Coil Axial Flux PM Machines: Evaluation and Tests
Publisher: IEEE
Year: 2014
FBI Measurement Facility for High Temperature Superconducting Cable Designs
Publisher: IEEE
Year: 2014