Search
Now showing items 1-10 of 67
Test Compaction by Sharing of Transparent-Scan Sequences Among Logic Blocks
Publisher: IEEE
Year: 2014
Utilizing ATE Vector Repeat With Linear Decompressor for Test Vector Compression
Publisher: IEEE
Year: 2014
Study on WeChat User Behaviors of University Graduates
Publisher: IEEE
Year: 2014
Improving efficiency of extensible processors by using approximate custom instructions
Publisher: IEEE
Year: 2014
Bubble shape estimation in gas-liquid slug flow using wire-mesh sensor and advanced data processing
Publisher: IEEE
Year: 2014
COMeT+: Continuous Online Memory Testing with Multi-Threading Extension
Publisher: IEEE
Year: 2014
Reducing the input test data volume under transparent scan
Publisher: IET
Year: 2014
Silicon Odometers: Compact In Situ Aging Sensors for Robust System Design
Publisher: IEEE
Year: 2014