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Spotting automatically cross-language relations

Type: Conference Paper

Author : Tomassetti, F. , Rizzo, G. , Torchiano, M.

Publisher: IEEE

Year: 2014

Experimental Study of Remote Job Submission and Execution on LRM through Grid Computing Mechanisms

Type: Conference Paper

Author : Prajapati, H.B. , Shah, V.A.

Publisher: IEEE

Year: 2014

Compact hardware oriented number recognition algorithm for real-time speed traffic-sign recognition

Type: Conference Paper

Publisher: IEEE

Year: 2014

Quality assessment of chromatic variations: A study of Full-Reference and No-Reference Metrics

Type: Conference Paper

Author : Bernardo, Marco V.; Pinheiro, Antonio M.G.; Fiadeiro, Paulo T.; Pereira, Manuela

Publisher: IEEE

Year: 2014

Reflectance measurements of triangular lattice GaAs nanowire arrays

Type: Conference Paper

Author : Kakko, Joona-Pekko; Haggren, Tuomas; Huhtio, Teppo; Dhaka, Veer; Lipsanen, Harri

Publisher: IEEE

Year: 2014

An ultra-compact, untrimmed CMOS bandgap reference with 3σ inaccuracy of +0.64% in 16nm FinFET

Type: Conference Paper

Author : Chang, Chin-Ho; Horng, Jaw-Juinn; Kundu, Amit; Chang, Chih-Chiang; Peng, Yung-Chow

Publisher: IEEE

Year: 2014

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Spotting automatically cross-language relations

Experimental Study of Remote Job Submission and Execution on LRM through Grid Computing Mechanisms

Compact hardware oriented number recognition algorithm for real-time speed traffic-sign recognition

Quality assessment of chromatic variations: A study of Full-Reference and No-Reference Metrics

Reflectance measurements of triangular lattice GaAs nanowire arrays

An ultra-compact, untrimmed CMOS bandgap reference with 3σ inaccuracy of +0.64% in 16nm FinFET

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Spotting automatically cross-language relations

Experimental Study of Remote Job Submission and Execution on LRM through Grid Computing Mechanisms

Compact hardware oriented number recognition algorithm for real-time speed traffic-sign recognition

Quality assessment of chromatic variations: A study of Full-Reference and No-Reference Metrics

Reflectance measurements of triangular lattice GaAs nanowire arrays

An ultra-compact, untrimmed CMOS bandgap reference with 3&#x03C3; inaccuracy of &#x002B;0.64% in 16nm FinFET

An ultra-compact, untrimmed CMOS bandgap reference with 3σ inaccuracy of +0.64% in 16nm FinFET