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Now showing items 1-5 of 5
Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips
Publisher: IEEE
Year: 2014
Investigation of Single Event Induced Soft Errors in Programmable Metallization Cell Memory
Publisher: IEEE
Year: 2014
Random-Walk Drift-Diffusion Charge-Collection Model For Reverse-Biased Junctions Embedded in Circuits
Publisher: IEEE
Year: 2014
A CMOS Triple Inter-Locked Latch for SEU Insensitivity Design
Publisher: IEEE
Year: 2014
Upsets in Phase Change Memories Due to High-LET Heavy Ions Impinging at an Angle
Publisher: IEEE
Year: 2014