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Details of the Magnetization Reversal in Patterned Exchange-Biased and Unbiased Thin Films

Type: Journal Paper

Author : Shull, Robert D.; Kabanov, Yuri P.; Chen, P.J.; Dennis, Cindi L.; Gornakov, Vladimir S.; Nikitenko, Valerian /I/.

Publisher: IEEE

Year: 2014

1-D FDTD EM, thermal, and displacement multiphysics simulations

Type: Conference Paper

Author : Eyde, Z.S. , Ziolkowski, R.W.

Publisher: IEEE

Year: 2014

Thick Double-Biased IrMn/NiFe/IrMn Planar Hall Effect Bridge Sensors

Type: Journal Paper

Author : Qejvanaj, Fatjon; Zubair, Mohammad; Persson, A.; Mohseni, S.M.; Fallahi, V.; Sani, S.R.; Chung, Shi-Uk; Tuan Le; Magnusson, F.; Akerman, J.

Publisher: IEEE

Year: 2014

Evaluation of Atomic Layer Stacking Structure and Curie Temperature of Magnetic Films for Thermally Assisted Recording Media (Invited)

Type: Journal Paper

Author : Saito, Sakuyoshi; Hinata, Shintaro; Takahashi, Masaharu

Publisher: IEEE

Year: 2014

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Details of the Magnetization Reversal in Patterned Exchange-Biased and Unbiased Thin Films

1-D FDTD EM, thermal, and displacement multiphysics simulations

Thick Double-Biased IrMn/NiFe/IrMn Planar Hall Effect Bridge Sensors

Evaluation of Atomic Layer Stacking Structure and Curie Temperature of Magnetic Films for Thermally Assisted Recording Media (Invited)

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Details of the Magnetization Reversal in Patterned Exchange-Biased and Unbiased Thin Films

1-D FDTD EM, thermal, and displacement multiphysics simulations

Thick Double-Biased IrMn/NiFe/IrMn Planar Hall Effect Bridge Sensors

Evaluation of Atomic Layer Stacking Structure and Curie Temperature of Magnetic Films for Thermally Assisted Recording Media (Invited)