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Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM

Type: Journal Paper

Author : Wang Kang; Zheng Li; Zhaohao Wang; Deng, Erya; Klein, Jacques-Olivier; Youguang Zhang; Chappert, Claude; Ravelosona, Dafine; Weisheng Zhao

Publisher: IEEE

Year: 2014

Variation-Tolerant and Disturbance-Free Sensing Circuit for Deep Nanometer STT-MRAM

Type: Journal Paper

Author : Wang Kang; Zheng Li; Klein, Jacques-Olivier; Yuanqing Chen; Youguang Zhang; Ravelosona, Dafine; Chappert, Claude; Weisheng Zhao

Publisher: IEEE

Year: 2014

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Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM

Variation-Tolerant and Disturbance-Free Sensing Circuit for Deep Nanometer STT-MRAM

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Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM

Variation-Tolerant and Disturbance-Free Sensing Circuit for Deep Nanometer STT-MRAM