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Now showing items 1-10 of 15

Quantitative model verification in VANET based on interval probabilistic timed automata

Type: Conference Paper

Author : Qiang Li , Xiaoyan Wang , Shufen Liu

Publisher: IEEE

Year: 2014

Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SoI (ETSoI) MOSFETs

Type: Journal Paper

Author : Zhaoyun Tang; Bo Tang; Lichuan Zhao; Guilei Wang; Jing Xu; Yefeng Xu; Hongli Wang; Dahai Wang; Junfeng Li; Fujiang Lin; Jiang Yan; Chao Zhao; Tianchun Ye

Publisher: IEEE

Year: 2014

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

Type: Journal Paper

Author : I-Chung Chiu; I-Chun Cheng

Publisher: IEEE

Year: 2014

Realization of an Image-Based XXY Positioning Platform Control

Type: Conference Paper

Publisher: IEEE

Year: 2014

Energy Consumption of Photo Sharing in Online Social Networks

Type: Conference Paper

Publisher: IEEE

Year: 2014

Towards an SLA-Based Service Allocation in Multi-cloud Environments

Type: Conference Paper

Author : Farokhi, S.

Publisher: IEEE

Year: 2014

Achieving security assurance with assertion-based application construction

Type: Conference Paper

Author : Rubio-Medrano, C.E.; Gail-Joon Ahn; Sohr, K.

Publisher: IEEE

Year: 2014

AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors

Type: Journal Paper

Author : Raghuraman, Mathangi; Sambandan, Sanjiv

Publisher: IEEE

Year: 2014

Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

Type: Journal Paper

Author : Geng-Wei Chang; Ting-Chang Chang; Jhe-Ciou Jhu; Tsung-Ming Tsai; Kuan-Chang Chang; Yong-En Syu; Ya-Hsiang Tai; Fu-Yen Jian; Ya-Chi Hung

Publisher: IEEE

Year: 2014

Research on active voltage stability of distribution network based on the bifurcation theory

Type: Conference Paper

Author : Guo, Quanli; Yuan, Shun; Gu, Cailian; Zhao, Zhigang

Publisher: IEEE

Year: 2014

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Quantitative model verification in VANET based on interval probabilistic timed automata

Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SoI (ETSoI) MOSFETs

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

Realization of an Image-Based XXY Positioning Platform Control

Energy Consumption of Photo Sharing in Online Social Networks

Towards an SLA-Based Service Allocation in Multi-cloud Environments

Achieving security assurance with assertion-based application construction

AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors

Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

Research on active voltage stability of distribution network based on the bifurcation theory

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Quantitative model verification in VANET based on interval probabilistic timed automata

Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SoI (ETSoI) MOSFETs

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

Realization of an Image-Based XXY Positioning Platform Control

Energy Consumption of Photo Sharing in Online Social Networks

Towards an SLA-Based Service Allocation in Multi-cloud Environments

Achieving security assurance with assertion-based application construction

AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors

Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors

Research on active voltage stability of distribution network based on the bifurcation theory