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ESD Detection Circuit and Associated Metal Fuse Investigations in CMOS Processes

Type: Journal Paper

Author : Kuhn, William B.; Eatinger, Ryan J.; Melton, Steven /A/.

Publisher: IEEE

Year: 2014

Globally Constrained Locally Optimized 3-D Power Delivery Networks

Type: Journal Paper

Author : Todri-Sanial, Aida; Kundu, Sandipan; Girard, P.; Bosio, A.; Dilillo, L.; Virazel, A.

Publisher: IEEE

Year: 2014

Author

Bosio, A. (1)

Dilillo, L. (1)

Eatinger, Ryan J. (1)

Girard, P. (1)

Kuhn, William B. (1)

Kundu, Sandipan (1)

Melton, Steven /A/. (1)

Todri-Sanial, Aida (1)

Virazel, A. (1)

Publisher

IEEE (2)

Year

2014 (2)

Keywords

electromigration (2)

3D integrated circuits (1)

3D PDN (1)

3D power delivery networks (1)

Algorithms (1)

Analytical models (1)

bridge power lines (1)

Capacitance (1)

capacitance 100 pF (1)

circuit optimisation (1)

Type

Journal Paper (2)

Language (ISO)

English (2)

Content Type

Metadata Only (2)

Publication Title

Device and Materials Reliability, IEEE Transactions on (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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