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Paper memory by all printing technology

Type: Conference Paper

Publisher: IEEE

Year: 2014

Direct Evaluation of Defect Distributions From Admittance Spectroscopy

Type: Journal Paper

Author : Weiss, Thomas P.; Redinger, Alex; Regesch, David; Mousel, Marina; Siebentritt, Susanne

Publisher: IEEE

Year: 2014

Improved Channel Hot-Carrier Reliability in <formula formulatype="inline"> <img src="/images/tex/387.gif" alt="p"> </formula>-FinFETs With Replacement Metal Gate by a Nitrogen Postdeposition Anneal Process

Type: Journal Paper

Author : Moonju Cho; Arimura, H.; Jae Woo Lee; Kaczer, Ben; Veloso, A.; Boccardi, Guillaume; Ragnarsson, Lars-Ake; Kauerauf, T.; Horiguchi, Naoto; Groeseneken, Guido

Publisher: IEEE

Year: 2014

Improving the Quality of Epitaxial Foils Produced Using a Porous Silicon-based Layer Transfer Process for High-Efficiency Thin-Film Crystalline Silicon Solar Cells

Type: Journal Paper

Author : Radhakrishnan, Hariharsudan Sivaramakrishnan; Martini, R.; Depauw, Valerie; Van Nieuwenhuysen, Kris; Debucquoy, Maarten; Govaerts, Jonathan; Gordon, I.; Mertens, Robert; Poortmans, Jozef

Publisher: IEEE

Year: 2014

Correlating Multicrystalline Silicon Defect Types Using Photoluminescence, Defect-band Emission, and Lock-in Thermography Imaging Techniques

Type: Journal Paper

Author : Johnston, Samuel; Guthrey, Harvey; Fei Yan; Zaunbrecher, K.; Al-Jassim, Mowafak; Rakotoniaina, Pati; Kaes, M.

Publisher: IEEE

Year: 2014

3.7 kV Vertical GaN PN Diodes

Type: Journal Paper

Author : Kizilyalli, Isik C.; Edwards, Andrew P.; Nie, Hui; Bour, David; Prunty, Thomas; Disney, Don

Publisher: IEEE

Year: 2014

Green-Emitting <formula formulatype="inline"> <img src="/images/tex/21402.gif" alt="(\\lambda =525~{\\rm nm})"> </formula> InGaN/GaN Quantum Dot Light Emitting Diodes Grown on Quantum Dot Dislocation Filters

Type: Journal Paper

Author : Banerjee, Adrish; Frost, Thomas; Jahangir, Shafat; Bhattacharya, Pallab

Publisher: IEEE

Year: 2014

Message from Nethealth workshop chairs

Type: Conference Paper

Author : Sabharwal, Ashutosh , Amrutur, Bharadwaj

Year: 2014

Effective Liveness Verification Using a Transformation-Based Framework

Type: Conference Paper

Year: 2014

Electromagnetic field distribution in areas surrounded by many wires

Type: Conference Paper

Author : Echigo, Hiroshi; Aizawa, Kazuo

Publisher: IEEE

Year: 2014

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Paper memory by all printing technology

Direct Evaluation of Defect Distributions From Admittance Spectroscopy

Improved Channel Hot-Carrier Reliability in <formula formulatype="inline"> <img src="/images/tex/387.gif" alt="p"> </formula>-FinFETs With Replacement Metal Gate by a Nitrogen Postdeposition Anneal Process

Improving the Quality of Epitaxial Foils Produced Using a Porous Silicon-based Layer Transfer Process for High-Efficiency Thin-Film Crystalline Silicon Solar Cells

Correlating Multicrystalline Silicon Defect Types Using Photoluminescence, Defect-band Emission, and Lock-in Thermography Imaging Techniques

3.7 kV Vertical GaN PN Diodes

Green-Emitting <formula formulatype="inline"> <img src="/images/tex/21402.gif" alt="(\\lambda =525~{\\rm nm})"> </formula> InGaN/GaN Quantum Dot Light Emitting Diodes Grown on Quantum Dot Dislocation Filters

Message from Nethealth workshop chairs

Effective Liveness Verification Using a Transformation-Based Framework

Electromagnetic field distribution in areas surrounded by many wires

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