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Application-Independent Testing of 3-D Field Programmable Gate Array Interconnect Faults

Type: Journal Paper

Author : Yen-Lin Peng; Ding-Ming Kwai; Yung-Fa Chou; Cheng-Wen Wu

Publisher: IEEE

Year: 2014

Circuit Level Modeling of Extra Combinational Delays in SRAM-Based FPGAs Due to Transient Ionizing Radiation

Type: Journal Paper

Author : Darvishi, Mostafa; Audet, Yves; Blaquiere, Yves; Thibeault, Claude; Pichette, Simon; Tazi, Fatima Zahra

Publisher: IEEE

Year: 2014

[Front cover]

Type: Conference Paper

Publisher: IEEE

Year: 2014

A 0.45mW 12b 12.5MS/s SAR ADC with digital calibration

Type: Conference Paper

Author : Wei Li; Tao Wang; Grilo, J.A.; Temes, G.C.

Publisher: IEEE

Year: 2014

Author

Audet, Yves (1)

Blaquiere, Yves (1)

Cheng-Wen Wu (1)

Darvishi, Mostafa (1)

Ding-Ming Kwai (1)

Grilo, J.A. (1)

Pichette, Simon (1)

Tao Wang (1)

Tazi, Fatima Zahra (1)

Temes, G.C. (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

configurable logic blocks (2)

field programmable gate arrays (2)

integrated circuit interconnections (2)

n field programmable gate arrays (2)

n logic design (2)

3D FPGA interconnects (1)

3D integration (1)

application-independent testing (1)

automatic test pattern generation (1)

automatic test pattern generator (1)

Type

Conference Paper (2)

Journal Paper (2)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

Nuclear Science, IEEE Transactions on (1)

omputational Intelligence for Human-like Intelligence (CIHLI), 2014 IEEE Symposium on (1)

ustom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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