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Now showing items 1-7 of 7

The Second Eye Movements Verification and Identification Competition

Type: Conference Paper

Author : Kasprowski, Pawel; Harezlak, Katarzyna

Publisher: IEEE

Year: 2014

Reduction of Negative Bias and Light Instability of a-IGZO TFTs by Dual-Gate Driving

Type: Journal Paper

Author : Sejin Hong; Suhui Lee; Mativenga, Mallory; Jin Jang

Publisher: IEEE

Year: 2014

High-Speed Dual-Gate a-IGZO TFT-Based Circuits With Top-Gate Offset Structure

Type: Journal Paper

Author : Xiuling Li; Di Geng; Mativenga, Mallory; Jin Jang

Publisher: IEEE

Year: 2014

Effect of Bulk-Accumulation on Switching Speed of Dual-Gate a-IGZO TFT-Based Circuits

Type: Journal Paper

Author : Xiuling Li; Di Geng; Mativenga, Mallory; Yuanfeng Chen; Jin Jang

Publisher: IEEE

Year: 2014

Reduction of Positive-Bias-Stress Effects in Bulk-Accumulation Amorphous-InGaZnO TFTs

Type: Journal Paper

Author : Seonghyun Jin; Tae-Woong Kim; Young-Gug Seol; Mativenga, Mallory; Jin Jang

Publisher: IEEE

Year: 2014

Removal of Negative-Bias-Illumination-Stress Instability in Amorphous-InGaZnO Thin-Film Transistors by Top-Gate Offset Structure

Type: Journal Paper

Author : Suhui Lee; Mativenga, Mallory; Jin Jang

Publisher: IEEE

Year: 2014

Research on the metering property of digital electricity meter

Type: Conference Paper

Author : Qi-xin Cai; Mei-mei Duan; Xiao-xing Mu; Jian Zhang

Publisher: IEEE

Year: 2014

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The Second Eye Movements Verification and Identification Competition

Reduction of Negative Bias and Light Instability of a-IGZO TFTs by Dual-Gate Driving

High-Speed Dual-Gate a-IGZO TFT-Based Circuits With Top-Gate Offset Structure

Effect of Bulk-Accumulation on Switching Speed of Dual-Gate a-IGZO TFT-Based Circuits

Reduction of Positive-Bias-Stress Effects in Bulk-Accumulation Amorphous-InGaZnO TFTs

Removal of Negative-Bias-Illumination-Stress Instability in Amorphous-InGaZnO Thin-Film Transistors by Top-Gate Offset Structure

Research on the metering property of digital electricity meter

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The Second Eye Movements Verification and Identification Competition

Reduction of Negative Bias and Light Instability of a-IGZO TFTs by Dual-Gate Driving

High-Speed Dual-Gate a-IGZO TFT-Based Circuits With Top-Gate Offset Structure

Effect of Bulk-Accumulation on Switching Speed of Dual-Gate a-IGZO TFT-Based Circuits

Reduction of Positive-Bias-Stress Effects in Bulk-Accumulation Amorphous-InGaZnO TFTs

Removal of Negative-Bias-Illumination-Stress Instability in Amorphous-InGaZnO Thin-Film Transistors by Top-Gate Offset Structure

Research on the metering property of digital electricity meter