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RISStatic Test Compaction for Scan Circuits by Using Restoration to Modify and Remove Tests
Publisher: IEEE
Year: 2014
Utilizing Circuit Structure for Scan Chain Diagnosis
Publisher: IEEE
Year: 2014
Program Committee and Steering Committee
Publisher: IEEE
Year: 2014
Considerations in the design of a boundary scan runtime library
Publisher: IEEE
Year: 2014
Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs
Publisher: IEEE
Year: 2014
Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States
Publisher: IEEE
Year: 2014
Pulse-Vanishing Test for Interposers Wires in 2.5-D IC
Publisher: IEEE
Year: 2014
[Copyright notice]
Publisher: IEEE
Year: 2014
A questionnaire for the evaluation of self-regulated learning support in software
Publisher: IEEE
Year: 2014
Research of hysteresis loss in large dry submersible motor with the fault of static eccentricity
Publisher: IEEE
Year: 2014