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Frequency Analysis of Atomic Force Microscopy Cantilevers in a Dynamic Mode Considering Tip Mass and Moment of Inertia
Year: 2006
Abstract:
In this paper, the high frequency analysis of a non-contact atomic force microscopy microcantilever
has been discussed. In modeling and simulation of micro-cantilever in previous investigations, mass and moment of ...
A Hybrid Approach for Predicting User's Future Request
Publisher: IEEE
Year: 2014
Submicron liquid crystal pixels on a nanopatterned indium tin oxide surface
Year: 2002
Abstract:
We have prepared a grooved indium tin oxide ~ITO! surface with groove widths of ;40–90 nm and
a variable groove separation up to 36 mm using atomic force microscopy nanolithography. Twisted
nematic pixels ...
Leveraging locality for FIB aggregation
Publisher: IEEE
Year: 2014
Design of Fractional Order Sliding Mode Controller for Chaos Suppression of Atomic Force Microscope System
Year: 2019
Abstract:
A novel nonlinear fractional order sliding mode controller is proposed to control the chaotic atomic force microscope system in presence of uncertainties and disturbances. In the design of the suggested fractional order controller, conformable...
Approach for improved positioning of an atomic force microscope piezoelectric tube scanner
Publisher: IET
Year: 2014
Physical and Electrical Characteristics of Silver-Copper Nanopaste as Alternative Die-Attach
Publisher: IEEE
Year: 2014